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IEC 60529 Test probe kits with Thrust

Model:BND-TPK08

Product Overview:

Our range of IEC 60529 test probes includes:

1. Sphere 50 mm Diameterprobe with 50N Force(BND-AF)

   • Ideal for testing protection against access to hazardous parts.
   • Ensures compliance with international safety standards.

2. Jointed Test Finger probe with 10N Force(BND-BF10)

   • Mimics human finger for realistic testing scenarios.
   • Highly accurate and durable.

3. Test Rod 2.5 mm Diameter, 100 mm Long with 3N Force(BND-CF)

   • Perfect for testing small openings.
   • Precision-engineered for reliable results.

4. Test Wire 1.0 mm Diameter, 100 mm Long with 1N Force(BND-DF)

   • Designed for intricate testing requirements.
   • Ensures thorough inspection of small gaps.

5. Electrical Contact  Indicator for test probes(BND-ZSQ)

• Provides safe, controlled low-voltage supply for various tests.
• Essential for comprehensive safety assessments.

Detailed Product Descriptions

BND-AF test probe A with 50N	test probe A with 50N	IEC60529  IEC61032  IEC60335 IEC61029  IEC60745  IEC60065 IEC60950	Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm Force :10N/20N/30N/40N/50N.
BND-BF10	test probe B with 10N	IEC61032  IEC60950  IEC60335 IEC60529  IEC60045  IEC60884 IEC60745	Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm Force :10N.
BND-CF	test probe C With 3N	IEC60335 IEC 61032 IEC 60529	Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm With force: 3N
BND-DF	test probe D with 1N	IEC60335 IEC 61032 IEC 60529	Test Probe Length:100mm Test Probe Diameter:1.0mm/2.5mm Dam-sphere Diameter:35mm Handle Diameter:10mm Handle Length:100mm Force:1N
BND-ZSQ	Electrical Contact Indicator for Test Finger Probe	IEC 60335 IEC 61032 IEC 60529	Input: AC 180-250V Output: 41-43V Fuse: 220V 2A